Instrumental Equipment of Laboratory of X-ray diffraction and spectrometry

• XRD - system XRD 3000 P (Seifert, Germany)

System XRD 3000 P of the German firm Seifert, computer controlled, Co and Cu tubes. System consists of a goniometr, 2 PC computers, one for measurement and another one for data evaluation with database PDF-4 on CD ROM containing aproximately 260.000 experimental and calculated powder patterns. The graphite monochromator is available to impove the quality of powder patterns measured, scintilation counter. Commercial software RAYFLEX from firm Seifert is available for data evaluation and search-match. Qualitative and quantitative phase analysis, Rietveld analysis, measurement of lattice parameters, thin film measurement, crystalline size determination.

• XRD - diffractometer Bruker AXS D8 (Bruker, Germany)

Diffractometer Bruker D8 of the German firm Bruker AXS, computer controlled, Cu tube. System consists of a goniometr, PC computer for data collection and evaluation with database PDF-4 on CD ROM containing aproximately 260.000 experimental and calculated powder patterns. The flat graphite monochromator, variable slits and scintilation counter are available to impove the quality of powder patterns measured. Commercial software BRUKER EVA from firm Bruker is available for data evaluation and search-match. High temperature measurement up to 1400°C possible in the air, vacuum or inert gas. Qualitative and quantitative phase analysis, Rietveld analysis, measurement of lattice parameters, thin film measurement, crystalline size determination.

• XRD - diffractometer PANalytical X´Pert PRO (PANanalytical, Holland)

Diffractometer X´Pert PRO of the Dutch firm PANanalytical, computer controlled, Cu tube. System consists of a goniometr, PC computer for data collection and evaluation with database PDF-4 on CD ROM containing aproximately 260.000 experimental and calculated powder patterns. The curved graphite monochromator, fixed slits and scintilation counter are available to improve the quality of powder patterns measured. Commercial software HighScore from firm PANalytical is available for data evaluation, search-match and profile fitting. Qualitative and quantitative phase analysis, Rietveld analysis, measurement of lattice parameters, thin film measurement, crystalline size determination.

• XRF - spectrometer ARL 9400 XP (THERMO ARL, Switzerland)

Fully automatic sequantial XRF spectrometer for qualitative and quantitative element analysis up to 83 elements of periodic table(B-C O-U) in the range from ppm to 100%. Possible samples – solid materials, powders, thin films and fluids. Rh tube, 4kW generator, 4 collimators, 6 crystals (AX 20, TLAP, PET, Ge 111, LiF 200, LiF 220), 2 detectors – proporcional and scintilation. Standardless analysis done with software UNIQUANT 4, analysis using calibration curve done with software Winxrf.

• CAD4 - single crystal diffractometer (Enraf-Nonius, Holland)

System CAD4 of the Dutch firm Enraf-Noniust, computer controlled, Cu and Mo tubes. System consists of a goniometr, 2 PC computers, one for measurement and another one for data evaluation. The flat graphite monochromator on primary beam is available to improve the quality of data measured, scintilation counter. Software Sir2004 for structure solution, Crystals for structure refinement and Ortep for graphical presentation are available.

Instrumental Equipment of collaborating departments

• XcaliburTMPX – single crystal diffractometer (Oxford - Diffraction England)

System Xcalibur of the English firm Oxford Diffraction, computer controlled, Cu and Mo tubes. System consists of a goniometr, enhance primary monochromator, 2D-detector ONYX, 700 series Cryostream Cooler for cooling down to liquid nitrogen from Oxford Cryosystems.

• Hitachi S-4700 – scanning electron microscop (HITACHI - Japan)

Hitachi S- 4700 is equipped with EDS analyser NORAN D-6823, field emission.

actual upgrade 2.6.2009