Prosím čekejte...
Nepřihlášený uživatel
logo VŠCHT
iduzel: 30011
idvazba: 38199
šablona: api_html
čas: 30.3.2020 01:38:40
verze: 4653
uzivatel:
remoteAPIs: https://cis-web-test.vscht.cz/studijni-system/
branch: trunk
Obnovit | RAW

Spectroscopic and Microscopic Methods for Characterization of Materials

Lecture Excercise/laboratory
2019, Summer Semester
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
Mo
Tu
We
Th
Fr
Credits 5
Hours per week 3 / 1 / 0
Examination C+Ex
Study Language Czech
Level []
Guarantor prof. RNDr. Ondrej Gedeon, Ph.D., DSc.

Summary

The course introduces the basic microscopic and spectroscopic methods used for characterization of materials. The course introduces energy levels of atom, molecule, and solid, covers physical principles of methods and their relation to instruments and sample preparations.

Syllabus

1. Spectrum and its origin, spectroscopic and microscopic methods, cross section, properties of particles and radiation.
2. Elastic and inelastic cross section, Compton scattering, photoelectric effect.
3. Quantum mechanics of atom, hydrogen atom, electron-electron and spin-orbital interaction, splitting of spectral lines.
4. Electron energy levels, atom terms, selection rules, energy bands in solid, Bloch function, quantum tunnelling.
5. Transmission electron microscopy, contrast, bright-field a dark-field observation, sample preparations.
6. Scanning electron microscopy, contrast, backscattered and secondary electrons, sample preparations.
7. Electron microprobe analysis, EDS and WDS configuration, principle of method, qualitative and quantitative analysis, correction methods, mapping. X-ray fluorescence spectroscopy.
8. Formation, structure, and properties of the surface. Photoelectron spectroscopy, principle of the method, satellite lines, angle-resolved spectroscopy, ultraviolet photoelectron spectroscopy. Auger spectroscopy, Auger microscopy.
9. Secondary Ion Mass spectrometry for solid, ion scattering, kinematic factor, sputtering yield, ionization probability, depth profiling, SNMS.
10. Other ion methods, channelling, proton induced X-ray emission spectroscopy, Rutherford backscattering spectroscopy, low energy ion spectroscopy.
11. Probe microscopies and their principles. Scanning tunnelling microscopy, atomic force microscopy, near-field optical microscopies.
12. Diffraction methods, diffraction of photons, electrons and neutrons. Structural factor. LEED and EBSD, neutron diffraction, X-ray diffraction, powder diffraction.
13. Vacuum and vacuum instruments. Vacuum measuring and pumps. Particle sources for photons, electrons, ions, and neutrons.
14. Detectors and analysers. Ionization chamber, crystal spectrometer, energy dispersive detector, scintillator, hemispherical analyser, quadrupole mass analyser, time-of-flight analyser, other detectors and analysers.

Literature

R: Y. Leng, Materials characterization, Wiley, 2008,ISBN 978-0-470-82298-2
A: R.F. Egerton, Physical principles of electron microscopy, Springer, 2006, ISBN-13: 978-0387-25800-0

VŠCHT Praha
Technická 5
166 28 Praha 6 – Dejvice
IČO: 60461373
DIČ: CZ60461373

Datová schránka: sp4j9ch

Copyright VŠCHT Praha
Za informace odpovídá Oddělení komunikace, technický správce Výpočetní centrum

VŠCHT Praha
na sociálních sítích
zobrazit plnou verzi